Economics, Finance, Business and Management, Industry and Industrial Studies, Manufacturing Industries
VLSI Test Principles and Architectures

VLSI Test Principles and Architectures: Design for Testability

,
Hardback Published on: 14/08/2006
£65.99
UK delivery included
In stock
Print on demand - Usually dispatched within 7-10 days
Make and edit your lists in your account
wordery
has a fantastic rating on
In stock
Print on demand - Usually dispatched within 7-10 days
wordery
has a fantastic rating on

Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Publisher information

  • Publisher: Elsevier Science
  • ISBN: 9780123705976
  • Number of pages: 777
  • Dimensions: 241 x 200 x 51 mm
  • Weight: 1806g
  • Languages: English