Computing and Information Technology, Computer Programming / Software Engineering, General

Automating Software Defect Detection Through Machine Learning and LLMs

Automating Software Defect Detection Through Machine Learning and LLMs

Bryan Gardiner (editor-in-chief), Pancham Singh (editor-in-chief), Prashant Upadhyay (editor-in-chief), Meetu Malhotra (editor-in-chief), Rahul Sharma (editor-in-chief)

Book Published on: 02/10/2025

£190

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Publisher information

Publisher: IGI Global Scientific Publishing
ISBN: 9798337344607
Languages: English