Mathematics and Science, Astronomy, Space and Time, Observatories, Equipment and Methods

Advances in X-Ray Analysis

Advances in X-Ray Analysis: Volume 29

Charles S. Barrett (editor-in-chief), jerome B. Cohen (editor-in-chief), Jr. John Faber (editor-in-chief), Ron Jenkins (editor-in-chief), Donald E. Leyden (editor-in-chief), John C. Russ (editor-in-chief), Paul K. Predecki (editor-in-chief)

Hardback Published on: 30/06/1986

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Publisher information

Publisher: Springer US
ISBN: 9780306422874
Number of pages: 600
Dimensions: 250 x 170 x 36 mm
Weight: 2310g
Languages: English