Advanced Mathematical And Computational Tools In Metrology And Testing Ix
Franco Pavese (editor-in-chief), Markus Baer (editor-in-chief), Jean-remy Filtz (editor-in-chief), Alistair B Forbes (editor-in-chief), Leslie Pendrill (editor-in-chief), Kastsuhiro Shirono (editor-in-chief)
Hardback Published on: 27/03/2012
Price: £149
wordery
wordery
Synopsis
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Publisher information
- Publisher: World Scientific
- ISBN: 9789814397940
- Dimensions: 229 x 157 x 28 mm
- Weight: 794g
- Languages: English
